国际学生入学条件
3.0 on all previous graduate level coursework (approximately a B+ average) (some exceptions apply)
An applicant was awarded a Master's degree at an accredited college/university in the United States and has been in residence in the United States continuously prior to application to SIU (not out of the country for more than one calendar year).
You have a minimum of 60 graded (A, B, C) hours of recent coursework completed at an accredited college / university in the United States with continuous residence in the United States prior to application at SIU. Pass / Fail, Satisfactory / Unsatisfactory, or Proficiency credit is not acceptable.
550 on the paper-based TOEFL
80 on the internet-based TOEFL
6.5 on the IELTS
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雅思考试总分
6.5
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雅思考试指南
- 雅思总分:6.5
- 托福网考总分:80
- 托福笔试总分:550
- 其他语言考试:C1 required on the Cambridge English Exam
CRICOS代码:
申请截止日期: 请与IDP顾问联系以获取详细信息。
课程简介
The College of Engineering offers graduate programs leading to the Master of Science and Doctor of Philosophy degrees. The Department of Electrical and Computer Engineering offers programs of study and research leading to the Master of Science degree in Electrical and Computer Engineering and the Doctor of Philosophy in Electrical and Computer Engineering. The Department provides a rich environment for educational and professional advancement in the following areas: Antennas, circuits and systems theory, electromagnetics, robust and adaptive control, robotics, embedded control, MEMS, plasma processing, energy conversion, power systems, power electronics, pattern recognition, image processing, biomedical engineering, neural networks, optical computing, stochastic modeling, wireless communications, detection and estimation theory, communication networks, mobile ad hoc networks, sensor networks, digital systems, programmable ASICs design, bioengineering, computer architecture, CMOS VLSI, fault tolerance, mixed signal testing and design, low power system design, hardware/software co-design, synthesis and verification of digital systems, physical design automation, and VLSI testing.
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