国际学生入学条件
A minimum of a 2:1 first degree in a relevant discipline/subject area (e.g. electronics)
A minimum 60% mark in the Project element or equivalent with a minimum 60% overall module average.
A minimum of English language proficiency (IELTS overall minimum score of 6.5).
Good understanding of analogue and digital circuit design
Also, the candidate is expected to:
Have excellent analytical, reporting and communication skills
Be self-motivated, independent and team player
Be genuine enthusiasm for the subject and technology
Have the willing to publish research findings in international journals
IELTS overall minimum score of 6.5
TOEFL
TOEFL iBT (we accept TOEFL iBT, TOEFL iBT Home Edition and TOEFL iBT Paper Edition) - 92 total and minimum skill component scores of 20 reading, 20 listening, 21 speaking and 20 writing.
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雅思考试总分
6.5
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雅思考试指南
- 雅思总分:6.5
- 托福网考总分:92
- 托福笔试总分:160
- 其他语言考试:PTE Academic UKVI - 65 overall and 62 in all skill components.
CRICOS代码:
申请截止日期: 请与IDP顾问联系以获取详细信息。
课程简介
Industrial applications such as aviation systems widely suffer from a particular type of fault known as No-Fault-Fault (NFF). Term NFF points to the fact that real failure remains hidden during the general troubleshooting due to its random nature. Hence, the potential failure cannot be fixed by evaluating technicians, and of course, it profoundly adds to the maintenance costs. Cause of NFF is attributed to various issues including oxidation, mechanical stresses (vibration) electromagnetic fields, poor design and bad/wrong operation. They cause various intermittency issues in, for instance, chassis, PCBs, connectors, cables and wires as the system gradually ages. The intermittent fault is a malfunction of a device or system that occurs at intervals (presenting irregularity) in a device or system that functions normally at other times. In many industrial applications such as in-line replaceable unit (LRU) of aviation systems, intermittent faults found in the power chain of a system can be cascaded into other electronic circuitry, processors, microcontrollers, and memories causing random intermittent failures.<br>Applicants are invited to investigate the impact of intermittency on control systems and conduct research in designing No-Fault-Found resistant control. The student will have the opportunity to work with National Instruments products including Compact-Rio and Labview in developing control systems, fault injection and emulation, collaborating with experts in the prognostics, diagnostics and condition monitoring field, as well as being part of our active and dynamic research centre at Cranfield.
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